| Title |
A New Defect Inspection Method for TFT-LCD Panel using Pattern Comparison |
| Authors |
이경민(Lee, Kyong-Min) ; 장문수(Jang, Moon-Soo) ; 박부견(Park, Poo-Gyeon) |
| Keywords |
검출 ; 결함 ; 베지어 ; 패널 ; 패턴 PCSR-G ; TFT-LCD |
| Abstract |
In this paper, we propose a novel defects inspection algorithm for TFT-LCD panels. We first compensate the distorted image caused by the camera distortion and the uneven illumination environment using the least squares method and the bezier surface. We find a starting point of each pattern for restricting each pattern. A clean image is compared to each pattern to find defects using modified PCSR-G algorithm. The simulation example shows that our algorithm not only inspects the defects well, but also is robust to the 1-pixel error. |