| Title |
Improvement in the Reliability of Bypass Diode at Photovoltaic Modules Through an Intelligent Cooling System |
| Authors |
고재환(Jaehwan Ko) ; 김충일(Chungil Kim) ; 이충근(Chung-Geun Lee) ; 이득광(Deukgwang Lee) ; 고명근(Myeong-Geun Ko) ; 고석환(Suk-Whan Ko) ; 송형준(Hyung-Jun Song) |
| DOI |
https://doi.org/10.5370/KIEE.2021.70.12.1870 |
| Keywords |
Photovoltaic; Bypass diode; Partial shading; Intelligent cooling system; Reliability |
| Abstract |
A Bypass diode maintains the efficiency and stability of photovoltaic systems (PV) under partial shading. However, the bypass diode failure may cause damage and fire in the PV system because the generated current continuously flows through it. Thus, we suggest an intelligent cooling fan system for the bypass diode to ensure the stability of PV. The cooling system consisted of a k-type temperature sensor, electrically controlled fan and auto-control system. If the temperature of bypass diode (?????) exceeds specific points owing to partial shading and/or its failure, the cooling system will automatically turn on the fan to prevent bypass diode from abnormal heating. The analysis of ????? indicates that the system effectively decreases it below the melting point of the junction box (177 ℃). The cooling system is adequate for PV under partal shading or with a damaged diode. Consequently, our suggested intelligent cooling system can contribute to the safe operation of PV. |