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  1. (Electrical Safety Research Institute, Korea Electrical Safety Corporation, Korea.)



PVC Insulated Wires, Insulation Degradation, Dielectric Breakdown, Reliability Analysis

1. ์„œ ๋ก 

ํ˜„์žฌ ์ „๊ธฐ์„ค๋น„์˜ ์ˆ˜๋ช…์—ฐํ•œ์€ ๊ณ ์•• ์ด์ƒ์˜ ์„ค๋น„ ์œ„์ฃผ๋กœ ์ œ์‹œ๋˜๊ณ  ์žˆ๋‹ค. ํ•œ๊ตญ์ „๊ธฐ์•ˆ์ „๊ณต์‚ฌ์˜ 2018๋…„๋„ ์ „๊ธฐ์žฌํ•ด ํ†ต๊ณ„๋ถ„์„ ์ž๋ฃŒ์— ๋”ฐ๋ฅด๋ฉด, ์ €์••(380/220 V) ์ „๊ธฐํ™”์žฌ๋Š” ์ „์ฒด ์‚ฌ๊ณ ์˜ ์•ฝ 75 %๋ฅผ ์ ์œ ํ•˜๊ณ  ์žˆ์œผ๋ฉฐ, ์ธ์ž…๊ตฌ ๋ฐฐ์„ , ์˜ฅ๋‚ด๋ฐฐ์„ , ๊ธฐ๊ธฐ๋ฐฐ์„ ์„ ํฌํ•จํ•˜๋Š” ์ „์„ ๋ฅ˜๋Š” ๊ธฐ๊ธฐ๋ณ„ ์‚ฌ๊ณ  ํ˜„ํ™ฉ์—์„œ 668๊ฑด์œผ๋กœ 13 %๋ฅผ ์ ์œ ํ•˜๊ณ  ์žˆ๋‹ค (1).

PVC ์ ˆ์—ฐ ์ „์„ (IV, PVC insulated wire)์€ ๋„์ฒด ์œ„์— ํด๋ฆฌ์—ผํ™”๋น„๋‹(PVC, Polyvinyl chloride), ํด๋ฆฌ์—ํ‹ธ๋ Œ(PE, Polyethylene) ๋“ฑ์˜ ์ ˆ์—ฐ์žฌ๋ฃŒ๋งŒ์„ ํ”ผ๋ณตํ•œ ๊ฒƒ์œผ๋กœ, ์ ˆ์—ฐ์ฒด๊ฐ€ ์ ์šฉ๋˜์ง€ ์•Š๊ณ  ์‚ฌ์šฉ๋˜๋Š” ๋‚˜์„ ์— ๋น„ํ•ด ๊ฐ์ „ ๋“ฑ์˜ ์‚ฌ๊ณ ๋ฅผ ๋ฐฉ์ง€ํ•  ์ˆ˜ ์žˆ๋‹ค (2). ๊ทธ๋Ÿฌ๋‚˜ ๊ณ ์ „์••์—์„œ๋Š” ์ ‘์ด‰ ์‹œ ๊ฐ์ „์˜ ์œ„ํ—˜์ด ์žˆ์„ ์ˆ˜ ์žˆ์–ด ์ฃผ๋กœ ์กฐ๋ช…์šฉ, ์ „์—ด์šฉ, ์กฐ์ž‘ํŒจ๋„ ๋“ฑ์—์„œ ๋ฐฐ์„ ์šฉ์œผ๋กœ ๋งŽ์ด ์‚ฌ์šฉ๋œ๋‹ค. ์ „์„  ๋˜๋Š” ์ผ€์ด๋ธ”์˜ ์ˆ˜๋ช…์€ ์ฃผ๋กœ ์ ˆ์—ฐ์ฒด์˜ ์„ฑ๋Šฅ์— ์ขŒ์šฐ๋˜๋ฉฐ, ํฌ๊ฒŒ ์—ด์ , ๊ธฐ๊ณ„์ , ์ „๊ธฐ์  ์—ดํ™”์š”์ธ์ด ์ž‘์šฉํ•˜๋ฉฐ, ์ˆ˜๋ช…์€ ํฌ์„ค์ƒํƒœ์™€ ์ˆ˜๋ถ„์˜ ์˜ํ–ฅ, ์‚ฌ์šฉ ํ™˜๊ฒฝ์— ๋”ฐ๋ฅธ ์ฃผ์œ„ ์˜จ๋„, ๋ถ€ํ•˜์œจ์— ๋”ฐ๋ผ ๋‹ฌ๋ผ์ง€๋ฏ€๋กœ, ๊ฐ๊ด€์ ์ธ ์ˆ˜๋ช…์„ ์˜ˆ์ธกํ•˜๋Š”๋ฐ ์–ด๋ ค์›€์ด ์žˆ๋‹ค (3).

์ €์•• ๊ตฌ๋‚ด๋ฐฐ์„ ์˜ ๋‚ด๊ตฌ์—ฐํ•œ์€ ๊ตญ๋‚ด์˜ ๊ฒฝ์šฐ ๊ธฐ์ค€ ๋ฐ ๊ด€๋ จ ๊ทผ๊ฑฐ๋Š” ๋ช…ํ™•ํžˆ ์ œ์‹œ๋˜์ง€ ์•Š๊ณ  ์žˆ๋‹ค. ๊ตญ์™ธ์˜ ๊ฒฝ์šฐ ์ผ๋ณธ์ „์„ ๊ณต์—…ํšŒ(JCMA, Japanese Electric Wire & Cable Makers' Association) ์ ˆ์—ฐ์ „์„ ์ „๋ฌธ์œ„์›ํšŒ์˜ ๋ณด๊ณ ์„œ์— ๋”ฐ๋ฅด๋ฉด IV, HIV ๋“ฑ ์ ˆ์—ฐ์ „์„ ์˜ ๊ฒฝ์šฐ ์‹ค๋‚ด, ์ „์„ ๊ด€, ๋•ํŠธ ํฌ์„ค, ๋ถ„์ „๋ฐ˜๋‚ด๋ฐฐ์„ ๊ณผ ์‹ค์™ธ ํฌ์„ค์„ ๊ตฌ๋ถ„ํ•˜์—ฌ ๊ฐ๊ฐ 20~30๋…„, 15~20๋…„์œผ๋กœ ์ˆ˜๋ช…์„ ๋‹ฌ๋ฆฌ ์ œ์‹œํ•˜๊ณ  ํ•˜๊ณ  ์žˆ๋‹ค (4).

์ „์„ ์˜ ์ˆ˜๋ช… ์˜ˆ์ธก ์—ฐ๊ตฌ๋Š” ํ†ต์ƒ ์˜จ๋„, ์ „์•• ๋“ฑ ๊ฐ€์†์ŠคํŠธ๋ ˆ์Šค ์ธ์ž๋ฅผ ์ด์šฉํ•œ ํ†ต์ œ๋œ ๊ฐ€์†์‹œํ—˜์—ฐ๊ตฌ๊ฐ€ ์ฃผ๋ฅผ ์ด๋ฃจ๊ณ  ์žˆ๋‹ค. ๊ฐ€์†์ŠคํŠธ๋ ˆ์Šค-์ˆ˜๋ช… ๋ชจํ˜•์‹์œผ๋กœ ์˜จ๋„์˜ ๊ฒฝ์šฐ ์•„๋ ˆ๋‹ˆ์šฐ์Šค ์‹(Arrhenius equation)์„ ์ ์šฉํ•˜๋ฉฐ, ์ „์••์˜ ๊ฒฝ์šฐ ์—ญ๋ˆ„์Šน ๋ฒ•์น™(Inverse square law)์„ ์ ์šฉํ•˜๋Š”๋ฐ, ์ „๊ธฐ ์ ˆ์—ฐ์žฌ๋ฃŒ์˜ ๊ฒฝ์šฐ ์ฃผ๋กœ ์˜จ๋„๋ฅผ ์ฑ„ํƒํ•˜๊ณ  ์žˆ๋‹ค (5). ๊ตฌ์ฒด์ ์œผ๋กœ 3๊ฐœ์˜ ์˜จ๋„ ์กฐ๊ฑด์—์„œ ๊ฐ€์†์—ดํ™”์‹œํ—˜์„ ์ˆ˜ํ–‰ํ•˜์—ฌ ๋…ธํ™” ์ „ํ›„ ์ ˆ์—ฐ์ฒด์˜ ๋ฌด๊ฒŒ, ์ธ์žฅ๊ฐ•๋„(Tensile strength), ์‹ ์žฅ๋ฅ (Elongation) ๋“ฑ ๊ธฐ๊ณ„์  ํŠน์„ฑ ๋ณ€ํ™”๋ฅผ ํ†ตํ•ด ํ†ต๊ณ„์ ์œผ๋กœ ์ˆ˜๋ช…์„ ์ถ”์ •ํ•˜๋Š” ์—ฐ๊ตฌ๊ฐ€ ์ˆ˜ํ–‰๋˜์—ˆ๋‹ค (6-8). ๊ฐ€์†์ˆ˜๋ช…์‹œํ—˜ ์™ธ ์ „์••ํŒŒ๊ดด์‹œํ—˜์„ ์ด์šฉํ•œ ์—ฐ๊ตฌ๋Š” ๊ฒฝ์šฐ 2006๋…„ 9์›” JCMA ๊ธฐ์ˆ ์ž๋ฃŒ์— 6,600 V ๊ฐ€๊ตํด๋ฆฌ์—ํ‹ธ๋ Œ ์ ˆ์—ฐ, ๋น„๋‹์‹œ์Šค ์ผ€์ด๋ธ”(CV, XLPE Insulated and PVC Sheathed Power Cable)์„ ๋Œ€์ƒ์œผ๋กœ ๊ฐ์ข… ํฌ์„คํ™˜๊ฒฝ ํ•˜์—์„œ ์žฅ๊ธฐ๊ฐ„ ์‚ฌ์šฉ๋œ ์ˆ˜๊ฑฐ ์ผ€์ด๋ธ”์˜ ์‚ฌ์šฉ์—ฐ์ˆ˜์™€ ์ž”์กด๊ต๋ฅ˜ ํŒŒ๊ดด์ „์••ํŠน์„ฑ์˜ ๊ด€๊ณ„๋ฅผ ์กฐ์‚ฌํ•˜์—ฌ ๋ฌผ์˜ ์˜ํ–ฅ ์—ฌ๋ถ€์— ๋”ฐ๋ผ ์žˆ์„ ๊ฒฝ์šฐ 17๋…„, ์—†์„ ๊ฒฝ์šฐ 27๋…„์„ ์ œ์‹œํ•œ ์‚ฌ๋ก€๊ฐ€ ์žˆ๋‹ค (9).

๋ณธ ์—ฐ๊ตฌ์—์„œ๋Š” 450/750V PVC ์ ˆ์—ฐ์ „์„ ์„ 3๊ฐœ์˜ ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„๋กœ ํ˜„์žฅ์—์„œ ์ˆ˜๊ฑฐํ•˜์—ฌ ์ ˆ์—ฐํŒŒ๊ดด์‹œํ—˜์„ ์ˆ˜ํ–‰ํ•˜์—ฌ ์‚ฌ์šฉ๊ธฐ๊ฐ„๊ณผ ์ ˆ์—ฐ๋‚ด๋ ฅ ๊ฐ„์˜ ์ƒ๊ด€์„ฑ์„ ๋ถ„์„ํ•˜์˜€๋‹ค. ์‹œํ—˜์€ IV ์ ˆ์—ฐ์ „์„  ์‹œ๋ฃŒ์— AC์ „์••์„ ์ผ์ •์†๋„๋กœ ์ธ๊ฐ€ํ•˜์—ฌ ์ ˆ์—ฐํŒŒ๊ดด ์ „์••์„ ์ธก์ •ํ•˜์˜€๋‹ค. ์ด๋กœ๋ถ€ํ„ฐ ์–ป์–ด์ง„ ์ ˆ์—ฐํŒŒ๊ดด์ „์•• ๋ฐ์ดํ„ฐ๋ฅผ ํ†ต๊ณ„๋ถ„์„ํ”„๋กœ๊ทธ๋žจ์„ ํ™œ์šฉํ•˜์—ฌ ๋Œ€์ˆ˜์ •๊ทœ๋ถ„ํฌ(Log-normal distribution) ํ™•๋ฅ ์„ ์ด์šฉํ•˜์—ฌ ์ „๊ธฐ ์ ˆ์—ฐ ์žฌ๋ฃŒ์˜ ์ˆ˜๋ช… ํ‰๊ฐ€ ๊ธฐ์ค€๊ณผ ๋ฐฑ๋ถ„์œ„์ˆ˜์— ๋”ฐ๋ฅธ ํ†ต๊ณ„์  ์ˆ˜๋ช…์„ ์ถ”์ •ํ•˜์˜€๋‹ค.

2. ์ ˆ์—ฐํŒŒ๊ดด์™€ ์ˆ˜๋ช…์˜ˆ์ธก์— ๋Œ€ํ•œ ์ด๋ก ์  ๊ณ ์ฐฐ

2.1 ์ „๊ธฐ ์ ˆ์—ฐ์žฌ๋ฃŒ์˜ ์ ˆ์—ฐํŒŒ๊ดด ๋ฉ”์ปค๋‹ˆ์ฆ˜

์ „๊ธฐ์žฌ๋ฃŒ์˜ ์ ˆ์—ฐํŒŒ๊ดด ํ˜„์ƒ์€ ์ธ๊ฐ€๋˜๋Š” ์ „๊ณ„๊ฐ€ ํฌ๊ฒŒ ๋˜์–ด ํŠน์ • ๊ฐ’์— ๋„๋‹ฌํ•˜๋ฉด ๊ฐ‘์ž๊ธฐ ๋Œ€์ „๋ฅ˜๊ฐ€ ํ˜๋Ÿฌ ๋„์ฒด์™€ ๊ฐ™์ด ๋˜๋Š” ํ˜„์ƒ์„ ์˜๋ฏธํ•œ๋‹ค. ์ ˆ์—ฐํŒŒ๊ดด์ „์••์„ V ๋ผ ํ•˜๊ณ  ์‹œ๋ฃŒ์˜ ๋‘๊ป˜ d๋กœ ๋‚˜๋ˆˆ ๊ฐ’์„ ์ ˆ์—ฐํŒŒ๊ดด๊ฐ•๋„ v ๋˜๋Š” ์ ˆ์—ฐ๋‚ด๋ ฅ์œผ๋กœ ์ •์˜ํ•œ๋‹ค. ์ ˆ์—ฐ์ฒด ์‹œ๋ฃŒ์˜ ๋‘๊ป˜๋ฅผ ์ฆ๊ฐ€์‹œํ‚ค๋ฉด ์ ˆ์—ฐํŒŒ๊ดด์ „์••์€ ์ฆ๊ฐ€ํ•˜๋‚˜ ์ ˆ์—ฐํŒŒ๊ดด๊ฐ•๋„ ๋˜๋Š” ์ ˆ์—ฐ๋‚ด๋ ฅ์€ ๊ฐ์†Œํ•œ๋‹ค (10). ์ ˆ์—ฐ์ฒด์˜ ๋‘๊ป˜์™€ ์ ˆ์—ฐ๊ฐ•๋„์˜ ์ƒ๊ด€์„ฑ์€ Kinzbrunner ์‹ V=vd1/2๊ณผ Baur ์‹ V=ฮบd2/3์œผ๋กœ ์ œ์‹œ๋œ๋‹ค (11). ์—ฌ๊ธฐ์„œ ฮบ๋Š” ์ƒ์ˆ˜์ด๋‹ค. ์ ˆ์—ฐํŒŒ๊ดด๊ฐ•๋„์™€ ๊ฐ€์••์‹œ๊ฐ„์€ ์งง์€ ์‹œ๊ฐ„์˜ ๊ณ ์••์€ ๊ฒฌ๋”œ ์ˆ˜ ์žˆ์œผ๋‚˜ ์žฅ์‹œ๊ฐ„์ผ ๊ฒฝ์šฐ ํ›จ์”ฌ ๋‚ฎ์€ ์‹œํ—˜์ „์••์—์„œ๋Š” ํŒŒ๊ดด๋  ์ˆ˜ ์žˆ๋‹ค. ์ด๋Š” ์œ ์ „์ฒด๋ฅผ ํŒŒ๊ดด ์‹œํ‚ค๋Š” ๋ฐ ์ผ์ •๋Ÿ‰ ์ด์ƒ์˜ ์—๋„ˆ์ง€๊ฐ€ ํ•„์š”ํ•จ์„ ์˜๋ฏธํ•œ๋‹ค. ๊ทธ ์™ธ ์ ˆ์—ฐํŒŒ๊ดด ์‹œํ—˜ ์‹œ ์‹œํ—˜์ „์•• ์ข…๋ฅ˜, ์ธ๊ฐ€์ „์••์˜ ์ฃผํŒŒ์ˆ˜, ์‹œ๋ฃŒ ํ‘œ๋ฉด์˜ ์Šต์œค ์ƒํƒœ, ์ธก์ • ์˜จ๋„ ๋“ฑ ์— ๋”ฐ๋ผ ์ธก์ •๊ฐ’์„ ๋‹ค๋ฅด๊ฒŒ ์–ป์„ ์ˆ˜ ์žˆ๋‹ค.

2.2 ์ „๊ธฐ์ ˆ์—ฐ์žฌ๋ฃŒ์˜ ์ˆ˜๋ช…์˜ˆ์ธก ๊ธฐ๋ฒ•

์ ˆ์—ฐ์žฌ๋ฃŒ์˜ ์—ดํ™” ์š”์ธ์€ ํฌ๊ฒŒ ์—ด์ , ์ „๊ธฐ์ , ํ™˜๊ฒฝ์ , ๊ธฐ๊ณ„์ (TEEM, Thermal, Electrical, Environmental and Mechanical) ์ŠคํŠธ๋ ˆ์Šค๋กœ ๊ตฌ๋ถ„๋œ๋‹ค (3). ์ „๊ธฐ ์ ˆ์—ฐ์žฌ๋ฃŒ๋Š” ์ „๊ธฐ๊ธฐ๊ธฐ์˜ ์ „๋ฅ˜์— ์˜ํ•œ ๋ฐœ์—ด๋กœ ์—ด์  ์—ดํ™”๊ฐ€ ์ง„ํ–‰๋˜๋ฉฐ, ์‚ฌ์šฉ ์šฉ๋„์™€ ํ™˜๊ฒฝ์— ๋”ฐ๋ผ ์—ดํŒฝ์ฐฝ๊ณผ ์ˆ˜์ถ• ๋“ฑ ๊ธฐ๊ณ„์  ๋งˆ๋ชจ์— ์˜ํ•œ ์—ดํ™”, ๊ณ ์ „๊ณ„ ๋“ฑ ์ „๊ธฐ์  ์—ดํ™” ๋“ฑ์ด ์ง€์†์ ์ธ ์„ฑ๋Šฅ ์ €ํ•˜๊ฐ€ ์ง„ํ–‰๋œ๋‹ค. ๋…ธํ›„ ์ ˆ์—ฐ์žฌ๋ฃŒ์˜ ๊ฒฝ์šฐ ์ด๋Ÿฌํ•œ ์—ดํ™” ์š”์ธ์ด ๋ณตํ•ฉ์ ์œผ๋กœ ์ž‘์šฉ๋˜์—ˆ์„ ๊ฒƒ์œผ๋กœ ๊ฐ€์ •ํ•˜๋ฉฐ, ์‚ฌ์šฉ ๊ธฐ๊ฐ„๋ณ„๋กœ ์ ˆ์—ฐ์„ฑ๋Šฅ ์ €ํ•˜๋ฅผ ํŒ๋‹จํ•  ์ˆ˜ ์žˆ๋Š” ํŠน์„ฑ์น˜๋กœ ์ธ์žฅ์„ธ๊ธฐ, ์‹ ์œจ, ๋„์ „์œจ, ํŒŒ๊ดด์ „์•• ๋“ฑ์„ ํ‰๊ฐ€ ์š”์†Œ๋ฅผ ์ ์šฉ๋˜๊ณ  ์žˆ๋‹ค.

์ ˆ์—ฐ์žฌ๋ฃŒ์˜ ์ˆ˜๋ช…์€ ์‹ ๋ขฐ๋„ ๋ถ„์„์„ ํ†ตํ•ด ํ™•๋ฅ  ๋ณ€์ˆ˜๋กœ ํ‘œํ˜„๋˜๋ฉฐ, ์ œํ’ˆ์ด ๊ณ ์žฅ ์—†์ด ๊ธฐ๋Šฅ์„ ์ˆ˜ํ–‰ํ•˜๋Š” ํŠน์ • ์‹œ๊ฐ„์œผ๋กœ ์ •์˜๋œ๋‹ค. ๋…ธํ›„ IV์ „์„ ์˜ ์ ˆ์—ฐ์žฌ๋ฃŒ์˜ ์ ˆ์—ฐํŒŒ๊ดด ์‹œํ—˜ ๋ฐ์ดํ„ฐ๋Š” ํ†ต๊ณ„ ๋ถ„์„ ๊ธฐ๋ฒ•์„ ์ ์šฉํ•œ ์ˆ˜๋ช… ํ‰๊ฐ€์— ํ™œ์šฉํ•œ๋‹ค. ์ผ๋ฐ˜์ ์œผ๋กœ ํ™•๋ฅ (Probability)๋กœ ์ •์˜๋˜๋Š” ๊ฐœ๋…์˜ ์‹ ๋ขฐ๋„๋ฅผ ์ ์šฉํ•œ๋‹ค (5).

๊ทธ๋ฆผ. 1. ์ ˆ์—ฐ์—ดํ™”์˜ ๊ทผ๋ณธ ์›์ธ

Fig. 1. Root causes of insulation deterioration

../../Resources/kiee/KIEE.2020.69.4.623/fig1.png

๊ทธ๋ฆผ 1์˜ ์‹ ๋ขฐ์„ฑ ๊ด€๋ จ ์ฒ™๋„๋ฅผ ๊ฐœ๋…์ ์œผ๋กœ ๋‚˜ํƒ€๋‚ธ ๊ฒƒ์œผ๋กœ, ์‹ ๋ขฐ๋„ ํ•จ์ˆ˜(R(t), Reliability function or Survival function)๋Š” ์ฃผ์–ด์ง„ t ์‹œ์  ์ด์ „๊นŒ์ง€ ๊ณ ์žฅ์ด ๋‚˜์ง€ ์•Š์„ ํ™•๋ฅ ๋กœ ์‹ (1)๊ณผ ๊ฐ™์ด ์ •์˜๋œ๋‹ค.

(1)
R(t)=Pr[T>t]=1โˆ’โˆซt0f(x)dx=1โˆ’F(t)

์—ฌ๊ธฐ์„œ, T๋Š” ์ œํ’ˆ์˜ ์ˆ˜๋ช…(Lifetime) ๋˜๋Š” ๊ณ ์žฅ์‹œ๊ฐ„(Failure time)์ด๋ฉฐ, F(x)๋Š” ์ˆ˜๋ช…์˜ ๋ˆ„์  ๋ถ„ํฌํ•จ์ˆ˜(CDF, Cumulative Density function)๋กœ t ์ด๋‚ด์— ๊ณ ์žฅ์ด ๋ฐœ์ƒํ•  ํ™•๋ฅ ๋กœ ์ •์˜๋œ๋‹ค.

์‹ ๋ขฐ์„ฑ ์ฒ™๋„๋กœ MTTF(MTTF, Mean Time To Failure), MTBF(MTBF, Mean Time Between Failure), ๋ฐฑ๋ถ„์œ„์ˆ˜(percentile) ๋“ฑ์ด ์‚ฌ์šฉ๋œ๋‹ค. MTTF๋Š” ์ˆ˜๋ฆฌ ๋ถˆ๊ฐ€๋Šฅํ•œ ์ œํ’ˆ์˜ ๊ณ ์žฅ์ด ๋ฐœ์ƒํ•  ๋•Œ๊นŒ์ง€์˜ ํ‰๊ท  ์‹œ๊ฐ„์œผ๋กœ ์ •์˜๋˜๋ฉฐ, MTBF๋Š” ์ˆ˜๋ฆฌ ๊ฐ€๋Šฅํ•œ ์ œํ’ˆ์˜ ๊ณ ์žฅ ๊ฐ„ ํ‰๊ท  ์‹œ๊ฐ„์œผ๋กœ ์ •์˜๋œ๋‹ค. ๋ฐฑ๋ถ„์œ„์ˆ˜๋Š” ๋ˆ„์ ๋ถ„ํฌํ•จ์ˆ˜ F(t)์˜ ๊ฐ’์ด p๊ฐ€ ๋˜๋Š” ์‹œ์ ์œผ๋กœ ์ •์˜๋œ๋‹ค. ์‹ ๋ขฐ์„ฑ ๋ถ„์„์—์„œ๋Š” ์‹œ๊ฐ„ t์— ๋”ฐ๋ฅธ ๊ณ ์žฅ๋ฅ  ฮป(t)์˜ ๊ฒฝํ–ฅ์— ๋”ฐ๋ผ ์ˆ˜๋ช… ๋ถ„ํฌ๋ฅผ ์ฆ๊ฐ€(IFR, Increasing failure rate), ๊ฐ์†Œ(DFR, Decreasing failure rate), ์ƒ์ˆ˜(CFR, Constant failure rate) ๋“ฑ์œผ๋กœ ๊ตฌ๋ถ„ํ•  ์ˆ˜ ์žˆ๋‹ค. ์ ˆ์—ฐ์žฌ๋ฃŒ๋Š” ์‹œ๊ฐ„์— ๋”ฐ๋ผ ์„ฑ๋Šฅ์ด ๊ฐ์†Œํ•˜๋ฉฐ, ์ฃผ๋กœ ์š•์กฐ๊ณก์„ (Bath-tub curve)์œผ๋กœ ํ‘œํ˜„๋˜๋ฉฐ, ์ดˆ๊ธฐ๊ณ ์žฅ์€ ์„ค๊ณ„/์ œ์กฐ ์˜ค๋ฅ˜, ๋ถ€์ ์ ˆํ•œ ๋ถ€ํ’ˆ ์‚ฌ์šฉ ๋“ฑ์— ์˜ํ•ด ๋ฐœ์ƒํ•˜๋ฉฐ, ์ถฉ๋ถ„ํ•œ ๋””๋ฒ„๊น…(Debugging)๊ณผ ํ‘œ์ค€ ์žฌ๋ฃŒ ์‚ฌ์šฉ์œผ๋กœ ํ•ด๊ฒฐ๊ฐ€๋Šฅํ•˜๋‹ค. ์ž„์˜๊ณ ์žฅ ์˜์—ญ์€ ์ œํ’ˆ ์‚ฌ์–‘์„ ์ดˆ๊ณผํ•œ ๊ณผ์ค‘ํ•œ ๋ถ€ํ•˜ ๋˜๋Š” ๋‚ฎ์€ ์•ˆ์ „ ๋งˆ์ง„์— ์˜ํ•ด ๋ฐœ์ƒํ•œ๋‹ค. ๋์œผ๋กœ, ๋งˆ๋ชจ๊ณ ์žฅ(Wear-out failure)์€ ๋งˆ๋ชจ, ๋…ธํ™”, ๋ถ€์‹์— ์˜ํ•ด ๋ฐœ์ƒํ•œ๋‹ค.

๊ทธ๋ฆผ. 2. ์‹ ๋ขฐ์„ฑ ์ด๋ก  ๋ฐ ์ฒ™๋„

Fig. 2. Conceptual diagram of theory and indicators for reliability analysis

../../Resources/kiee/KIEE.2020.69.4.623/fig2.png

์‹ ๋ขฐ์„ฑ ๋ถ„์„์€ ํ†ต์ƒ ํ˜„์žฅ๋ฐ์ดํ„ฐ(Field data) ์ˆ˜์ง‘ ๋ฐ ์กฐ๊ฑด๋ณ„ ๋ถ„๋ฅ˜ ํ›„ ๋ฐ์ดํ„ฐ ๋ถ„ํฌ ์–‘์ƒ์„ ํ™•์ธํ•˜์—ฌ A-D (Anderson-Darling)๊ฐ’์„ ์ด์šฉํ•˜์—ฌ ์ ํ•ฉํ•œ ์ˆ˜๋ช…๋ถ„ํฌ๋ฅผ ์„ ์ •ํ•œ๋‹ค (12). ์—ฌ๊ธฐ์„œ ์ˆ˜๋ช…๋ถ„ํฌ๋Š” ํ™•๋ฅ ๋ฐ€๋„ํ•จ์ˆ˜ ๋˜๋Š” ๋ˆ„์ ๋ถ„ํฌํ•จ์ˆ˜๋กœ ํ‘œํ˜„๋˜๋ฉฐ, ์ ˆ์—ฐํŒŒ๊ดด์‹œํ—˜์˜ ๊ฒฝ์šฐ ๋Œ€์ˆ˜์ •๊ทœ๋ถ„ํฌ๋ฅผ ์ ํ•ฉํ•œ๋‹ค. ๋Œ€์ˆ˜์ •๊ทœ ๋ถ„ํฌ๋Š” ์›จ์ด๋ธ” ๋ถ„ํฌ์™€ ์œ ์‚ฌํ•˜๊ฒŒ ์˜ค๋ฅธ์ชฝ์œผ๋กœ ์น˜์šฐ์นœ ๋ฐ์ดํ„ฐ๋ฅผ ๋ชจํ˜•ํ™” ํ•  ์ˆ˜ ์žˆ๋‹ค (5). ์œ„ํ—˜ํ•จ์ˆ˜๋Š” ์ฆ๊ฐ€ํ•˜๋‹ค๊ฐ€ ์ผ์ •๊ธฐ๊ฐ„ ํ›„ ๊ฐ์†Œํ•˜๋Š” ๋ชจ์–‘์„ ๋ณด์ธ๋‹ค. ์ด ๋ถ„ํฌ๋Š” ์—ดํ™” ๊ณผ์ •์— ์˜ํ•ด ๋ฐœ์ƒ๋˜๋Š” ๊ณ ์žฅ์— ๋Œ€ํ•œ ๋ชจํ˜•์œผ๋กœ ์ ํ•ฉํ•˜์—ฌ ์ข…์ข… ํ”ผ๋กœ์™€ ๋ถ€ํ•˜ ์‹œํ—˜์—์„œ ํŒŒ๊ดด ์‹œ๊ฐ„์„ ๋ชจ๋ธ๋งํ•˜๋Š”๋ฐ ์‚ฌ์šฉ๋ฉ๋‹ˆ๋‹ค. ํ•˜์ง€๋งŒ, ๋กœ๊ทธ์ •๊ทœ๋ถ„ํฌ๋Š” ๋ถ„ํฌ์˜ ๋ชจ์–‘๊ณผ ์ ํ•ฉํ•  ์ˆ˜ ์žˆ๋Š” ๊ณ ์žฅ ๋ชจ๋“œ์— ๋Œ€ํ•œ ๊ด€์ ์—์„œ ์›จ์ด๋ธ” ๋ถ„ํฌ์™€ ๊ฐ™์€ ์œ ์—ฐ์„ฑ์€ ์—†๋‹ค.

๋Œ€์ˆ˜์ •๊ทœ๋ถ„ํฌ๋Š” ์ž์—ฐ๋กœ๊ทธ(Natural logarithm)๋ฅผ ์ทจํ•˜๋ฉด ์ •๊ทœ๋ถ„ํฌ๊ฐ€ ๋˜๋Š” ๋ถ„ํฌ๋ผ๋Š” ์˜๋ฏธ์ž…๋‹ˆ๋‹ค. ์ฆ‰ ์—ฐ์†ํ™•๋ฅ ๋ณ€์ˆ˜ X๊ฐ€ ์ •๊ทœ๋ถ„ํฌ N(ฮผ,ฯƒ2)๋ฅผ ๋”ฐ๋ฅผ ๋•Œ, ํ™•๋ฅ ๋ณ€์ˆ˜ T=eX์˜ ๋ถ„ํฌ๋ฅผ ๊ตฌํ•ด๋ณด๋ฉด ํ™•๋ฅ ๋ฐ€๋„ํ•จ์ˆ˜ fT(t)๋Š” ์‹ (2)์™€ ๊ฐ™์œผ๋ฉฐ, ํ™•๋ฅ ๋ณ€์ˆ˜ T๋Š” ๋Œ€์ˆ˜์ •๊ทœ๋ถ„ํฌ๋ฅผ ๋”ฐ๋ฅธ๋‹ค๊ณ  ํ•œ๋‹ค.

(2)
fT(t)=1โˆš2ฯ€ฯƒtexp(โˆ’(lntโˆ’ฮผ)22ฯƒ2)=1ฯƒtฯ•(lntโˆ’ฮผฯƒ)

3. ์ ˆ์—ฐํŒŒ๊ดด ์‹œํ—˜ ๋ฐ ๋ถ„์„

3.1 ์ ˆ์—ฐํŒŒ๊ดด ์‹œํ—˜ ์„ค๊ณ„

์ ˆ์—ฐํŒŒ๊ดด์‹œํ—˜์€ ASTM D 149์˜ ์‹œํ—˜๋ฐฉ๋ฒ•๊ณผ ๊ทธ ํ‰๊ฐ€๋กœ IEC 60216-1์„ ์ ์šฉํ•˜์˜€๋‹ค (13-14). ์‹œํ—˜์ „์••์€ ์ ˆ์—ฐํŒŒ๊ดด๊ฐ€ 30์ดˆ ์ด๋‚ด์— ์ผ์–ด๋‚˜๋„๋ก ์ผ์ •ํ•œ ์†๋„(1.0 kV/sec)๋กœ ์ „์••์„ ์ธ๊ฐ€ํ•˜๋Š” ๋‹จ์‹œ๊ฐ„๋ฒ•(Short time)์„ ์ฑ„ํƒํ•˜์˜€๋‹ค. ๋…ธํ›„ IV์ „์„  ์‹œ๋ฃŒ๋Š” ๊ตญ๋‚ด์—์„œ ์˜ฅ๋‚ด ๋ฐฐ์„  ์žฌ๋ฃŒ๋กœ ๋งŽ์ด ์‚ฌ์šฉ๋˜๊ณ  ์žˆ๋Š” ๋‹จ์‹ฌ PVC ์ ˆ์—ฐ์ „์„ ์„ ์™„์„ฑํ’ˆ ํ˜•ํƒœ๋กœ ์‚ฌ์šฉํ•˜์˜€์œผ๋ฉฐ, ์—ฐ๋ฉด๋ฐฉ์ „์„ ๊ณ ๋ คํ•˜์—ฌ 500 mm์˜ ํฌ๊ธฐ๋กœ ๊ฐ 6๊ฐœ์”ฉ ์ค€๋น„ํ•˜์˜€๋‹ค. ์ฃผ์š” ์‚ฌ์–‘์€ ์ •๊ฒฉ์ „์••์€ 450/750 V, ๊ตต๊ธฐ 2.5 ใŽŸ์ด๋‹ค. ์ปจ๋•ํ„ฐ๋Š” ๋‹จ์‹ฌ ๊ตฌ๋ฆฌ์ด๋ฉฐ, ์ ˆ์—ฐ์ฒด๋Š” PVC์ด๋‹ค.

์‹œ๋ฃŒ๋Š” ์‚ฌ์šฉ๊ธฐ๊ฐ„์— ๋”ฐ๋ผ ์‹ ํ’ˆ์€ ์ˆ˜๋ช…๊ทธ๋ฃน(Aging group) #1, ์‚ฌ์šฉ๊ธฐ๊ฐ„ 19๋…„์€ ์ˆ˜๋ช…๊ทธ๋ฃน #2, ์‚ฌ์šฉ๊ธฐ๊ฐ„ 34๋…„์€ ์ˆ˜๋ช…๊ทธ๋ฃน #3์œผ๋กœ ๊ตฌ๋ถ„ํ•˜์˜€๋‹ค. ๊ทธ๋Ÿผ 3๊ณผ ๊ฐ™์ด 16 ์‹œ๊ฐ„ ์ˆ˜์กฐ ์นจ์ˆ˜ ๋ฐ ์ค‘๊ฐ„์  ์ ‘์ง€์„  ์—ฐ๊ฒฐ ๋“ฑ ์‹œ๋ฃŒ ์ „์ฒ˜๋ฆฌ ํ›„ AC ์ „์••์„ ๋™์ผ ์†๋„๋กœ ์ธ๊ฐ€ํ•˜์—ฌ ํŒŒ๊ดด ์‹œ์ ์˜ ์ „์••์„ ์ธก์ •ํ•˜์˜€๋‹ค.

ํ‘œ 1. AC ์ ˆ์—ฐํŒŒ๊ดด์‹œํ—˜ ์„ค๊ณ„

Table 1. AC breakdown voltage test design

Test system

AC Dielectric Test System

Test method

Short time method

Test voltage

1.0 kV/sec until 30 kV

Failure Criteria

Not more than 50 % of the initial design dielectric breakdown voltage

๊ทธ๋ฆผ. 3. ๊ต๋ฅ˜ ์ ˆ์—ฐํŒŒ๊ดด์‹œํ—˜ ์ ˆ์ฐจ

Fig. 3. Procedure for AC dielectric breakdown test

../../Resources/kiee/KIEE.2020.69.4.623/fig3.png

์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„ 6๊ฐœ์˜ ์‹œ๋ฃŒ์˜ ์ ˆ์—ฐ์ „์••์ธก์ •๊ฒฐ๊ณผ๋Š” ํ‘œ 2์™€ ๊ฐ™์œผ๋ฉฐ, ์ˆ˜๋ช…๊ทธ๋ฃน #3์˜ ์‹œ๋ฃŒ 3๋ฒˆ์˜ ๊ฒฝ์šฐ ์ „์„  ์ œ์ž‘ ๋ถˆ๋Ÿ‰์œผ๋กœ 1.7 kV์—์„œ ์ ˆ์—ฐ์ด ํŒŒ๊ดด๋˜์–ด ์ตœ์ข… ์ธก์ • ๋ฐ์ดํ„ฐ์—์„œ ์ œ์™ธํ•˜์˜€๋‹ค.

ํ‘œ 2. ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„ ์ ˆ์—ฐํŒŒ๊ดด์ „์•• ์ธก์ • ๊ฒฐ๊ณผ

Table 2. Results of AC dielectric breakdown voltage test by aging group

Sample

Breakdown voltage (kV)

Aging #1

Aging #2

Aging #3

1

28.4

28.2

30.8

2

30.8

29.2

28.2

3

28.6

27.6

*

4

30.9

27.2

25.1

5

28.1

26.6

27

6

28.6

26.2

24.7

Average

29.07

27.50

26.24

ํ‘œ 2์˜ ์ธก์ • ๋ฐ์ดํ„ฐ๋ฅผ ํ™œ์šฉํ•˜์—ฌ ๊ทธ๋ฆผ 4์™€ ๊ฐ™์ด ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„ ์ ˆ์—ฐํŒŒ๊ดด์ „์•• ๋ถ„ํฌ๋กœ ๋„์‹ํ™”ํ•˜์˜€๋‹ค. ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„ ํ‰๊ท ๊ฐ’์„ ๋น„๊ตํ•˜๋ฉด, ์ˆ˜๋ช…๊ทธ๋ฃน #1์˜ ํ‰๊ท ์€ 29.63 kV, ์ˆ˜๋ช…๊ทธ๋ฃน #2์˜ ํ‰๊ท ์€ 27.50 kV ๊ทธ๋ฆฌ๊ณ  ์ˆ˜๋ช…๊ทธ๋ฃน #3์˜ ํ‰๊ท ์ด 25.80 kV๋กœ ์‚ฌ์šฉ๊ธฐ๊ฐ„์ด ๊ธธ์ˆ˜๋ก IV์ „์„ ์˜ PVC์ ˆ์—ฐ์ฒด์˜ ์ ˆ์—ฐ๋‚ด๋ ฅ ์„ฑ๋Šฅ์€ ์ €ํ•˜๋จ์„ ํ™•์ธํ•˜์˜€๋‹ค.

๊ทธ๋ฆผ. 4. IV์ „์„ ์˜ ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„ ์ ˆ์—ฐํŒŒ๊ดด์ „์•• ๋ถ„ํฌ

Fig. 4. Distribution plot of dielectric breakdown voltage by aging group of IV wires

../../Resources/kiee/KIEE.2020.69.4.623/fig4.png

3.2 ์‹ ๋ขฐ์„ฑ ๋ถ„์„

์‹œํ—˜๋ฐ์ดํ„ฐ๋ฅผ ๊ธฐ๋ฐ˜์œผ๋กœ ์ƒ์šฉํ†ต๊ณ„ํ•ด์„ํ”„๋กœ๊ทธ๋žจ์ธ ๋ฏธ๋‹ˆํƒญ์„ ํ™œ์šฉํ•˜์—ฌ ์‹ ๋ขฐ์„ฑ ๋ถ„์„์„ ์ˆ˜ํ–‰ํ•˜์˜€๋‹ค (15). ๋ฐ์ดํ„ฐ ๋ถ„ํฌ ์–‘์ƒ์„ ํ™•์ธํ•˜๊ณ  ํŒŒ๊ดด์‹œํ—˜์— ์ ํ•ฉํ•œ ๋Œ€์ˆ˜์ •๊ทœ๋ถ„ํฌ๋ฅผ ์ ์šฉํ•˜์—ฌ ๊ทธ๋ฆผ 5์™€ ๊ฐ™์ด ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„๋กœ ๋ฐฑ๋ถ„์œ„์ˆ˜๋ฅผ % ๋‹จ์œ„๋กœ ๋„์‹ํ™” ํ•˜์˜€๋‹ค. ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„๋กœ ์ ˆ์—ฐํŒŒ๊ดด์ „์•• ๋ฐ์ดํ„ฐ์— ๋Œ€์‘๋˜๋Š” ๋ฐฑ๋ถ„์œ„ ์ˆ˜๋Š” ๊ณ ์žฅ๋ฅ ์„ ์˜๋ฏธํ•˜๋ฉฐ, ์ˆ˜๋ช…๊ทธ๋ฃน #1์€ ๋นจ๊ฐ„์ƒ‰ ๋„ค๋ชจ, #2๋Š” ํŒŒ๋ž€์ƒ‰ ์› ๊ทธ๋ฆฌ๊ณ  #3๋Š” ๋…น์ƒ‰ ์„ธ๋ชจ๋กœ ๋‚˜ํƒ€๋‚ธ๋‹ค. ๊ฐ ๋ฐ์ดํ„ฐ ๋ถ„ํฌ์—์„œ ๊ฒ€์ •์ƒ‰ ์‹ค์„ ์˜ ๊ธฐ์ค€์„ ์€ ์ˆ˜๋ช…๋ถ„ํฌ ๋ฐฉ์ •์‹์„ ๊ธฐ์ค€์œผ๋กœ ์„ ํ˜•ํ™”๋˜๋Š”๋ฐ, ์ด๋Š” ๋ฐฑ ๋ถ„์œ„์ˆ˜๋กœ ํ‘œํ˜„๋œ ๊ณ ์žฅ ๋ฐ์ดํ„ฐ๊ฐ€ ๊ธฐ์ค€์„ ์— ๊ฐ€๊นŒ์šธ์ˆ˜๋ก ์ˆ˜๋ช…๋ถ„๋ฐฐ์— ์ ํ•ฉํ•˜๋‹ค๋Š” ๊ฒƒ์„ ์˜๋ฏธํ•œ๋‹ค. ๊ทธ๋ฆผ 5์—์„œ ๋นจ๊ฐ„์ƒ‰ ์ ์€ ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„๋กœ ๊ณ ์žฅ๋ฅ  50 %์— ๋Œ€์‘๋˜๋Š” ์ ˆ์—ฐํŒŒ๊ดด์ „์••์„ ํ‘œ์‹œํ•œ๋‹ค.

๊ทธ๋ฆผ. 5. IV์ „์„ ์˜ ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„ ์ ˆ์—ฐํŒŒ๊ดด์ „์•• ํ™•๋ฅ ๋„

Fig. 5. Probability plot of dielectric breakdown voltage by aging group of IV wires

../../Resources/kiee/KIEE.2020.69.4.623/fig5.png

IV์ „์„ ์˜ ํŒŒ๊ดด์ˆ˜๋ช…์€ ๊ทธ๋ฆผ 5์˜ 3๊ฐœ์˜ ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„ ๊ณ ์žฅ๋ฅ  50 %(B50)์—์„œ ์ ˆ์—ฐํŒŒ๊ดด์ „์••์„ ์‚ฌ์šฉํ•˜์—ฌ ๊ทธ๋ฆผ 6๊ณผ ๊ฐ™์ด ์„ ํ˜•์ ํ•ฉ(linear fitting)์„ ํ†ตํ•ด ์ˆ˜๋ช…-์ ˆ์—ฐํŒŒ๊ดด์ „์•• ๊ด€๊ณ„์‹์„ ๋„์ถœํ•˜์˜€๋‹ค. ๊ทธ๋ฆผ 6์—์„œ ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„ ํŒŒ๊ดด์ „์••์€ ํŒŒ๋ž€์ƒ‰ ๋„ค๋ชจ๋กœ ํ‘œ์‹œ๋˜๋ฉฐ, ์ ํ•ฉ์„ ์€ ๊ฒ€์ •์ƒ‰ ์ ์„ ์œผ๋กœ ์‚ฌ์šฉ ๊ฒฝ๊ณผ์— ๋”ฐ๋ฅธ ์ ˆ์—ฐ๋‚ด๋ ฅ ์„ฑ๋Šฅ์˜ ์ €ํ•˜์— ๋Œ€ํ•œ ์ถ”์„ธ๋ฅผ ๋‚˜ํƒ€๋‚ธ๋‹ค. ๋งŒ์•ฝ ์ดˆ๊ธฐ ์„ค๊ณ„ํŒŒ๊ดด์ „์••์˜ 50 %๋ฅผ ๊ฐ€์ •ํ•œ๋‹ค๋ฉด ์˜ˆ์ƒ ํ‰๊ฐ€์ˆ˜๋ช…์€ 132๋…„์œผ๋กœ ๋นจ๊ฐ„์ƒ‰ ์ ์œผ๋กœ ํ‘œ์‹œ๋œ๋‹ค.

๊ทธ๋ฆผ. 6. IV์ „์„ ์˜ ์ ˆ์—ฐํŒŒ๊ดด์ „์••๊ณผ ์ˆ˜๋ช… ๊ด€๊ณ„์‹

Fig. 6. The relationship of dielectric breakdown voltage and expected lifetime of IV wires

../../Resources/kiee/KIEE.2020.69.4.623/fig6.png

IV์ „์„ ์˜ ์ ˆ์—ฐ์ฒด์˜ ์ˆ˜๋ช… ํŒ๋‹จ๊ธฐ์ค€๊ณผ ๊ณ ์žฅ๋ฅ ์— ๋”ฐ๋ฅธ ํ‰๊ฐ€์ˆ˜๋ช…์€ ๊ทธ๋ฆผ 7๊ณผ ๊ฐ™๋‹ค. ๊ณ ์žฅํŒ๋‹จ๊ธฐ์ค€์€ 50%, 60%, 70%, 80%, 90%์˜ ๋ฒ”์œ„๋ฅผ ๊ฐ€์ง€๋ฉฐ, ๊ณ ์žฅ๋ฅ ์€ ์ตœ์†Œ ํŒŒ๊ดด์„ค๊ณ„์ „์••์„ ๊ฐ€์ •ํ•œ 1%์™€ ์ผ๋ฐ˜์ ์œผ๋กœ ์ ์šฉ๋˜๋Š” 50%๋ฅผ ๊ฐ€์ •ํ•˜์˜€๋‹ค. ๊ทธ๋ฆผ 6์˜ ๊ด€๊ณ„์‹์„ ์ƒ๊ธฐ ์กฐ๊ฑด๋ณ„๋กœ ์‚ฐ์ถœํ•˜์—ฌ ๊ทธ๋ฆผ 7๊ณผ ๋„์‹ํ™” ํ•˜์˜€๋‹ค. ๊ณ ์žฅ ํŒ๋‹จ๊ธฐ์ค€๊ณผ ๊ณ ์žฅ๋ฅ ์ด ๋†’์„์ˆ˜๋ก ํ‰๊ฐ€์ˆ˜๋ช…์€ ์งง์•„์ง์„ ํ™•์ธํ•˜์˜€๋‹ค.

๊ทธ๋ฆผ. 7. ๊ณ ์žฅ ํŒ๋‹จ๊ธฐ์ค€๊ณผ ๊ณ ์žฅ๋ฅ ์— ๋”ฐ๋ฅธ ํŒŒ๊ดด์ˆ˜๋ช… ์ถ”์ •

Fig. 7. Estimation of failure life by failure criteria and failure rate

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4. ๊ฒฐ ๋ก 

๋ณธ ๋…ผ๋ฌธ์—์„œ๋Š” ์ €์•• ๊ตฌ๋‚ด๋ฐฐ์ „์„ค๋น„์˜ ์ˆ˜๋ช…ํ‰๊ฐ€๋ฅผ ์œ„ํ•ด ๋…ธํ›„ ์ˆ˜๊ฑฐํ’ˆ์˜ ์ ˆ์—ฐํŒŒ๊ดด์‹œํ—˜์„ ์ˆ˜ํ–‰ํ•˜์˜€๋‹ค. ์ด๋กœ๋ถ€ํ„ฐ ์–ป์–ด์ง„ ์ˆ˜๋ช…๋ฐ์ดํ„ฐ๋ฅผ ํ†ต๊ณ„๋ถ„์„ํ”„๋กœ๊ทธ๋žจ์„ ํ™œ์šฉํ•˜์—ฌ ๋ฐ์ดํ„ฐ ๋ถ„ํฌ ์ ํ•ฉ์„ฑ ๊ฒ€์ฆ์„ ํ†ตํ•ด ๋Œ€์ˆ˜์ •๊ทœ๋ถ„ํฌ๋ฅผ ์„ ์ •ํ•˜๊ณ  ์‹ ๋ขฐ์„ฑ ๋ถ„์„์„ ์ˆ˜ํ–‰ํ•˜์˜€๋‹ค. ๊ทธ ๊ฒฐ๊ณผ ๋‹ค์Œ๊ณผ ๊ฐ™์€ ๊ฒฐ๋ก ์„ ๋„์ถœํ•˜์˜€๋‹ค.

1) ์ „๊ธฐํ™”์žฌ ์‚ฌ๊ณ  ๋ฐœ์ƒ๋ฅ ์ด ๋†’์€ ๋…ธํ›„ ์ €์•• IV์ „์„  ์ˆ˜๊ฑฐํ’ˆ๊ณผ ์‹ ํ’ˆ์— ๋Œ€ํ•ด ASTM D 149์˜ ์‹œํ—˜๋ฐฉ๋ฒ•๊ณผ IEC 60216-1์˜ ํ‰๊ฐ€๊ธฐ์ค€์„ ์ ์šฉํ•˜์—ฌ ๋‹จ์‹œ๊ฐ„๋ฒ• ์‹œํ—˜์ „์•• ์ธ๊ฐ€๋ฅผ ํ†ตํ•ด ๊ต๋ฅ˜์ ˆ์—ฐํŒŒ๊ดด์‹œํ—˜์„ ์ˆ˜ํ–‰ํ•˜์˜€๋‹ค. ๊ทธ ๊ฒฐ๊ณผ 0๋…„(์‹ ํ’ˆ), 19๋…„, 34๋…„์˜ ์„ธ ๊ฐœ์˜ ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„ ์ ˆ์—ฐํŒŒ๊ดด์ „์•• ๋ถ„ํฌ ์–‘์ƒ์„ ํ†ตํ•ด ์‚ฌ์šฉ๊ธฐ๊ฐ„์ด ๊ธธ์ˆ˜๋ก IV์ „์„ ์˜ PVC ์ ˆ์—ฐ์ฒด์˜ ์ ˆ์—ฐ๋‚ด๋ ฅ ์„ฑ๋Šฅ์€ ์ €ํ•˜๋จ์„ ํ™•์ธํ•˜์˜€๋‹ค.

2) ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„ ์ ˆ์—ฐํŒŒ๊ดด ์‹œํ—˜์ „์•• ๋ฐ์ดํ„ฐ์— ๋Œ€ํ•œ ์ˆ˜๋ช…๋ถ„ํฌ ์ ํ•ฉ์„ฑ ๊ฒ€์ฆ์„ ํ†ตํ•ด ๋Œ€์ˆ˜์ •๊ทœ๋ถ„ํฌ๋ฅผ ์ ํ•ฉํ•˜์—ฌ ์‹ ๋ขฐ์„ฑ ๋ถ„์„์„ ์ˆ˜ํ–‰ํ•˜์˜€๋‹ค. ๊ทธ ๊ฒฐ๊ณผ IV์ „์„ ์˜ ์ ˆ์—ฐํŒŒ๊ดด์ˆ˜๋ช…์€ 3๊ฐœ์˜ ์ˆ˜๋ช…๊ทธ๋ฃน๋ณ„ ๊ณ ์žฅ๋ฅ  50 %์—์„œ์˜ ์ ˆ์—ฐํŒŒ๊ดด์ „์••์— ๋Œ€ํ•œ ์„ ํ˜•์ ํ•ฉ ๊ธฐ๋ฒ•์„ ์ ์šฉํ•˜์—ฌ ์ˆ˜๋ช…-์ ˆ์—ฐํŒŒ๊ดด์ „์••์— ๋Œ€ํ•œ ์‹คํ—˜์‹์„ ๋„์ถœํ•˜์˜€๋‹ค.

3) IV์ „์„ ์˜ PVC ์ ˆ์—ฐ์ฒด์˜ ๊ณ ์žฅํŒ๋‹จ๊ธฐ์ค€(50~90 %)์™€ ๊ณ ์žฅ๋ฅ (1 %, 50 %)์— ๋”ฐ๋ฅธ ํ‰๊ฐ€์ˆ˜๋ช…์„ ๊ด€๊ณ„์‹์œผ๋กœ๋ถ€ํ„ฐ ์‚ฐ์ถœํ•˜์˜€๋‹ค. ๊ทธ ๊ฒฐ๊ณผ ๊ณ ์žฅ ํŒ๋‹จ๊ธฐ์ค€๊ณผ ๊ณ ์žฅ๋ฅ ์ด ๋†’์„์ˆ˜๋ก ํŒŒ๊ดด์ˆ˜๋ช…์€ ์งง์•„์ง์„ ํ™•์ธํ•˜์˜€๋‹ค.

๋ณธ ์—ฐ๊ตฌ๋Š” ๋…ธํ›„ IV์ „์„ ์˜ ์ˆ˜๊ฑฐํ’ˆ์— ๋Œ€ํ•œ ์ „๊ธฐ์  ์„ฑ๋Šฅ ์ €ํ•˜ ์ •๋„์— ๋”ฐ๋ฅธ ์ˆ˜๋ช…๊ณผ์˜ ๊ด€๊ณ„๋ฅผ ์‹ ๋ขฐ์„ฑ ๋ถ„์„ ์ด๋ก ์„ ํ™œ์šฉํ•˜์—ฌ ๊ทœ๋ช…ํ•œ ๊ฒƒ์— ์˜์˜๊ฐ€ ์žˆ์œผ๋ฉฐ, ํ–ฅํ›„ ์„ค์น˜ํ™˜๊ฒฝ, ๋ถ€ํ•˜ ํŠน์„ฑ ๋“ฑ ๋‹ค์–‘ํ•œ ์กฐ๊ฑด์— ๋Œ€ํ•œ ํ‘œ๋ณธ ๋ถ„์„ ๋ฐ ๊ฐ€์†์—ดํ™”์‹œํ—˜์„ ํ†ตํ•œ ๋น„๊ต ๊ฒ€์ฆ์ด ํ›„์† ์—ฐ๊ตฌ๋กœ ํ•„์š”ํ•˜๋‹ค.

References

1 
Accessed 20 March 2020, A Statistical Analysis on the Electric Accident, Korea Electrical Safety Corporation,http://www.esps.or.kr/ reportboard/19/report.pdf, No. 28Google Search
2 
V. Babrauskas, 2005, Vechanisms and Modes for Ignition of Low-Voltage PVC Wires, Cables, and Cords, in Proc. of Fire & Materials Conf., San Francisco, pp. 291-309Google Search
3 
Greg C. Stone, Ian Culbert, Edward A. Boulter, Dhirani, 2004, Electrical Insulation for Rotating Machines: Design, Evaluation, Aging, Testing, and Repair, Wiley IEEE Press, pp. 44-49Google Search
4 
June 1989, Service Life of Insulated Wires and Cables, apanese Electric Wire & Cable Makers' Association(JCMA), Technical Committee on Insulated Wire, No. 107, pp. 297-304Google Search
5 
M Modarres, Mark P Kaminskiy, Vasily Krivtsov, 2016, Reliability Engineering and Risk Analysis: a Practical Guide,, CRC PressGoogle Search
6 
Hyung-Ju Park, Feb 2019, Lifetime Prediction on PVC Insulation Material for IV and HIV Insulated Wire, Journal of the Korean Society of Safety, Vol. 34, No. 1, pp. 8-13DOI
7 
Su-Gil Choi, Si-Kuk Kim, March 2019, A Study on the Performance Change of Insulation Sheath Due to Accelerated De- gradation of IV and HIV Insulated Wire, Korean Institute of Fire Science & Engineering, Vol. 33, No. 2, pp. 114-123DOI
8 
Youngju Park, Haepyeong Lee, August 2015, Identification on Carbon Oxide and Smoke Release Change of Aging Wire Cables, Journal of the Korean Society Hazard Mitigation, Vol. 15, No. 4Google Search
9 
September 2006, Guideline For Maintenance and Inspection of High Voltage CV Cable, apanese Electric Wire & Cable Makers' Association(JCMA), No. 116DGoogle Search
10 
Hermann Bohle, , Transformers; A Treatise on the Theory, Construction, Design, and Uses of Transformers, Auto Transformers, and Choking CoilsGoogle Search
11 
Chul-Ho Lee, July 2011, Evaluation of Insulation Characteristics of Polymer Insulating Materials, Journal of Electrical World, pp. 35-42Google Search
12 
Chong-Min Kim, Myeong-Il Choi, Young-Seok Kim, Sun-Bae Bang, Jung-Youl Seo, Dec 2010, A Study on the Real Condition and Life Time of the RCD, The Trans. of the Korean Institute of Electrical Engineers (KIEE), Vol. 59, No. 4, pp. 467-472Google Search
13 
Standard Test Method for Dielectric Breakdown Voltage and Dielectric Strength of Solid Electrical Insulating Materials at Commercial Power Frequencies., ASTM D 149-09Google Search
14 
Electrical Isulating Mterials - Thermal endurance properties - Part 1: Ageing procedures and evaluation of test results, Ed. 6.0., IEC 60216-1:2013Google Search
15 
Sun-Guen Seo, Feb 2009, Reliability Aalysis by Mnitab, Ire Tech Inc.Google Search

์ €์ž์†Œ๊ฐœ

์ •๊ธฐ์„ (Ki-Seok Jeong)
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He received the B.S., M.S., and Ph.D. degrees in electrical engineering from Kyungpook National University, Daegu, Korea, in 2008, 2010 and 2014, respectively.

From 2014 to 2016, he performed postdoctoral research at Korea Railroad Research Institute (KRRI).

He is currently senior researcher in the Electrical Safety Research Institute of Korea Electrical Safety Corporation (KESCO) since 2016.

E-mail : jksowl@kesco.or.kr

๊น€์˜์„ (Young-Seok Kim)
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He received the B.S., M.S., and Ph.D. degrees in electrical engineering from Gyeongsang National University, Jinju, Korea, in 1996, 1999 and 2004, respectively.

From 2001 to 2002, he was visiting fellow at Yamaguchi University, Japan.

He is currently head researcher in the Electrical Safety Research Institute of Korea Electrical Safety Corporation (KESCO) since 2003.

E-mail : athens9@kesco.or.kr

๊น€์ข…๋ฏผ (Chong-Min Kim)
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He received the B.S., M.S., degrees in electrical engineering from Jeonbuk National University, Jeonju, Korea, in 1998, 2001, respectively.

He is currently head researcher in the Electrical Safety Research Institute of Korea Electrical Safety Corporation (KESCO) since 2001.

E-mail : cmkim@kesco.or.kr

๊ถŒ์˜ค๋ฏผ (Oh-Min Kwon)
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He received the B.S., degree in electrical engineering from Jeonbuk National University, Jeonju, Korea, in 2016, where he has currently working forward the M.S. degree in electrical engineering.

He is currently researcher in the Electrical Safety Research Institute of Korea Electrical Safety Corporation (KESCO) since 2015.

E-mail : dhals1024@kesco.or.kr