• 대한전기학회
Mobile QR Code QR CODE : The Transactions of the Korean Institute of Electrical Engineers
  • COPE
  • kcse
  • 한국과학기술단체총연합회
  • 한국학술지인용색인
  • Scopus
  • crossref
  • orcid
The Transactions of the Korean Institute of Electrical Engineers

The Transactions of the Korean Institute of Electrical Engineers

ISO Journal TitleTrans. Korean. Inst. Elect. Eng.
SCImago Journal & Country Rank

Journal Search

  1. Home
  2. Archive
  3. 2022-11 (Vol.71 No.11)
  4. 10.5370/KIEE.2022.71.11.1673
XML PDF INFO REF

References

1 
Edward R. Sherwin, 2004, Analysis of "One-Shot" Devices, Selected Topics in Assurance Related Technologies, Vol. 7, No. 4, pp. 1-4Google Search
2 
S. J. Back, Y. K. Son, M. H. LEE, 2016, Estimation Methodology for Storage Reliability of One-shot System, The Korean Society of Propulsion Engineers, pp. 695-697Google Search
3 
2014, International Technology Roadmap for Photovoltaic, ITRPVGoogle Search
4 
A. Kumar, S. N. Melkote, 2018, Diamond wire sawing of solar silicon wafers: a sustainable manufacturing alternative to loose abrasive slurry sawing, Procedia. Manufacturing, Vol. 21, pp. 549-566DOI
5 
A. Kumar, S. Kaminski, S. N. Melkote, 2016, Effect of wear of diamond wire on surface morphology, roughness and subsurface damage of silicon wafers Wear, vol. 364, pp. 163-168DOI
6 
S. Lee, H. Kim, D. Kim, C. Park, 2015, Investigation on diamond wire break-in and its effects on cutting performance in multi-wire sawing, International Journal of Adv. Manuf. Technology, pp. 1-8DOI
7 
K. Sunder, H. Uhle, S. Knoppel, O. Anspach, 2013, Prediction of wire wear, wire bow and wafer total thickness variation in the diamond wire wafering process, EU PVSEC, pp. 1491-1495Google Search
8 
D. Kim, H. Kim, S. Lee, T. Lee, H. Jeong, 2016, Characterization of diamond wire-cutting performance for lifetime estimation and process optimization, J. Mech. Sci. Technology, Vol. 30, pp. 847-852DOI
9 
W. I. Clark, 2003, Fixed abrasive diamond wire machining-part I: process monitoring and wire tension force, Elsevier, pp. 523-532DOI
10 
Y. Zhao, W. Bi, P. Ge, 2021, An on-line inspection method for abrasive distribution uniformity of electroplated diamond wire saw, JMAPRO, Vol. 71, pp. 290-297DOI
11 
Y. Gao, 2014, Online Quality Inspection Technology for Electroplated Diamond Wire Based on Machine Vision, IEEE, 978-1- 4799-7397-2DOI
12 
S. J. Lee, H. J. Kim, D. Y. Kim, 2013, A Study on diamond wire characterization of Multi-wire Sawing Using Vision System, KSPE, pp. 31-32Google Search
13 
N. Otsu, 1979 Circuits, A threshold selection method from gray-level histograms, IEEE Trans. Syst. Man, Vol. cybern., No. vol. smc-9, pp. 62-66Google Search