C. Zhang, S. Liu, S. Li, Y. Ma, W. Lu, J. Huang, W. Sun, Z. Yang, Y. Zhu, and L. Ni,
“Investigation on the Degradation Mechanism for GaN Cascode Device Under Repetitive
Hard-Switching Stress,” IEEE Trans. Power Electron., vol. 37, no. 5, pp. 6009-6017,
May 2022.